%0 Journal Article
%A Qiu, Weihang
%A Zhang, Bo
%A Gu, Zhaofeng
%A Liu, Zijun
%A Shen, Xiang
%A Chen, Yimin

%D 
%J Chalcogenide Letters

%@ 1584-8663
%V 
%N 
%P {pages}

%T Structural Relaxation and Thermal Robustness of Electron-Beam Evaporated As<sub>2</sub>Se<sub>3</sub> Films for Far-Infrared Heterogeneous Metalenses
%M doi:10.32604/cl.2026.089518
%U http://www.techscience.com/CL/online/detail/28146