TY  - EJOU
AU  - Aqili, A. K. 
AU  - Abu-Omar, T. 
AU  - Al-Reyahi, A. Y. 
AU  - Shaheen, A. 
AU  - Al-Omari, S. 
AU  - Alhagish, I. 

TI  - Effect of phosphoric acid treatment on the physical properties of zinc telluride thin films
T2  - Chalcogenide Letters

PY  - 2023
VL  - 20
IS  - 2
SN  - 1584-8663

AB  - Zinc Telluride (ZnTe) films were prepared by the closed space sublimation (CSS) method. 
The effect of chemical treatments with concentrated phosphoric acid, on the optical, 
electric and structural properties of the films was studied. Zinc-blend structure of the 
polycrystalline nature of the films was confirmed by x-ray diffraction (XRD) spectra. The 
energy dispersive x-ray (EDX) shows an increase in Te ratio on the surface of the film as 
exposed to phosphoric acid. In addition, the dc electrical resistivity of the films was 
dropped considerably. The refractive index, thickness, and thickness irregularity of the 
films were determined by fitting of the optical transmittance spectra in the wavelength 
range 400 to 2500 nm. The effect, of treatment, on the optical parameters is also reported.
KW  - ZnTe
KW  -  Thin films
KW  -  Optical properties
KW  -  X-ray diffraction
KW  -  Zinc compound
KW  -  Semiconducting II-VI materials

DO  - 10.15251/CL.2023.202.113