@Article{CL.2023.207.477,
AUTHOR = {R. H. Athab, B. H. Hussein},
TITLE = {Fabrication and investigation of zinc telluride thin films},
JOURNAL = {Chalcogenide Letters},
VOLUME = {20},
YEAR = {2023},
NUMBER = {7},
PAGES = {477--485},
URL = {http://www.techscience.com/CL/v20n7/65256},
ISSN = {1584-8663},
ABSTRACT = {Zinc Telluride ZnTe alloys and thin film have been fabricated and deposited on glass 
substrates by thermal evaporation method which may be a suitable window layer of zinc 
telluride with different annealing temperatures (373 and473) K for 60 minutes in vacuum. 
Deposited thin films with thickness 100 nm was characteristic by using X-ray diffraction 
XRD to know structures, Atomic Force Microscopy (AFM) to evaluate surface topology, 
morphology. It was found out that the vacuum annealing improves on thin ZnTe films 
structure and surface morphology. Structural analysis reveals that ZnTe films have zinc 
blende structure of cubic phase with (111) preferred reflection and grain size is enhanced 
from 8.6 to 16.7 nm with annealing. Optical properties where optical bandgap energy 
values slightly decreased (2.3-2.2) eV as the annealing temperatures.},
DOI = {10.15251/CL.2023.207.477}
}