@Article{CL.2024.211.99,
AUTHOR = {A. B. Alwany, A. Alnakhlani, B. Hassan, M. A. Algradee, R. A. Fouad, A. A. Alfaqeer},
TITLE = {Effect of annealing temperature on the structural and optical properties of vacuum evaporated Cu<sub>13</sub>Se<sub>52</sub>Bi<sub>35</sub> thin films},
JOURNAL = {Chalcogenide Letters},
VOLUME = {21},
YEAR = {2024},
NUMBER = {1},
PAGES = {99--112},
URL = {http://www.techscience.com/CL/v21n1/65075},
ISSN = {1584-8663},
ABSTRACT = {Thermal evaporation technique was used to prepare Cu<sub>13</sub>Se<sub>52</sub>Bi<sub>35</sub> thin films. The asdeposited
 and annealed samples were investigated by using the X-ray diffraction (XRD), 
scanning electron microscopy (SEM) and optical transmission and reflection. The XRD 
showed that the as-deposited film is crystalline in nature, and the crystalline size of 
samples increased with increasing the annealing temperature. SEM images showed that the 
morphology of the sample changes with the annealing temperature. The direct transition of 
the optical band gap (E<sub>g</sub>) of Cu<sub>13</sub>Se<sub>52</sub>Bi<sub>35</sub> films was observed and the values of E<sub>g</sub> 
decreased with increasing the annealing temperature. Other optical parameters were also 
investigated. },
DOI = {10.15251/CL.2024.211.99}
}