@Article{CL.2024.2112.1035,
AUTHOR = {L. N. Ibrahimova, Kh. N. Ahmadova, M. E. Aliyev, Y. I. Aliyev},
TITLE = {Study of CdSe thin films using the spectroscopic ellipsometry method},
JOURNAL = {Chalcogenide Letters},
VOLUME = {21},
YEAR = {2024},
NUMBER = {12},
PAGES = {1035--1039},
URL = {http://www.techscience.com/CL/v21n12/64912},
ISSN = {1584-8663},
ABSTRACT = {In this research, we investigated the optical properties of CdSe thin films on glass substrates 
using spectroscopic ellipsometry. The samples were analysed using an M-2000 rotation 
compensator spectroscopic ellipsometer at room temperature, covering a photon energy 
range of 1.5-7.0 eV. We used an appropriate dispersion model to obtain the spectral 
dispersion of the optical constants. We calculated the thickness, dielectric permittivity (real 
and imaginary parts), refraction, and extinction coefficients of the thin layers. The results 
showed high transparency that varied with the size of the CdSe thin films. Additionally, we 
determined the bandgap width for samples with thicknesses of 350 nm and 400 nm, which 
were produced using the chemical deposition method. },
DOI = {10.15251/CL.2024.2112.1035}
}