@Article{CL.2024.215.377,
AUTHOR = {S. N. Yasinova, S. I. Mekhtiyeva, M. H. Huseynaliyev, R. I. Alekberov},
TITLE = {Properties of X-ray diffraction and Raman scattering in  PbSe, PbS and PbS<sub>0,5</sub>Se<sub>0,5</sub> thin films},
JOURNAL = {Chalcogenide Letters},
VOLUME = {21},
YEAR = {2024},
NUMBER = {5},
PAGES = {377--383},
URL = {http://www.techscience.com/CL/v21n5/65032},
ISSN = {1584-8663},
ABSTRACT = {Structural properties of PbSe, PbS and PbS<sub>0.5</sub>Se<sub>0.5</sub> thin films and mechanisms of 
combinational scattering of light from phonons were studied by X-ray diffraction and 
Raman spectroscopy methods. The results of X-ray diffraction show that the crystallite 
sizes found in the thin layers of the studied substances are in the order of nanometers and 
vary in the interval d~10.7 ÷ 30.8 nm. It was determined that the scattering bands of the 
PbSe<sub>0.5</sub>S<sub>0.5</sub> sample with large nanoparticle sizes shift to the region of large wave numbers 
compared to the scattering bands observed in the region of low wave numbers. },
DOI = {10.15251/CL.2024.215.377}
}