@Article{CL.2024.215.431,
AUTHOR = {G. S. Amirbekova, Zh. K. Tolepov, N. Guseinov, M. A. Tulegenova, T. Kuanyshbekov},
TITLE = {Influence of the distance between evaporation source and substrate on formation of lead telluride (PbTe) nanostructures by vacuum thermal evaporation method},
JOURNAL = {Chalcogenide Letters},
VOLUME = {21},
YEAR = {2024},
NUMBER = {5},
PAGES = {431--437},
URL = {http://www.techscience.com/CL/v21n5/65038},
ISSN = {1584-8663},
ABSTRACT = {Lead telluride nanostructures were obtained on silicon substrates by thermal evaporation 
in vacuum. Growth occurred at three different distances between the evaporation source 
and the substrate. The distances between the evaporator and the evaporation source were 5 
cm; 7.5 cm and 10 cm. Structural characteristics were studied using XRD, SEM, EDX, 
AFM analyses. These methods provided information about the crystal structure, 
morphology, microstructure and elemental composition of the material. X-ray diffraction 
analysis showed that thin films of lead telluride obtained by thermal evaporation in 
vacuum have a cubic crystal structure. This experimental work was carried out to 
determine the effect of distance on the structure of lead telluride (PbTe). During the 
experiment, the optimal modes for the formation of lead telluride (PbTe) nanostructures 
were determined, which was equal to d = 10 cm. It was found that lead telluride (PbTe) 
nanostructures are formed at this distance. },
DOI = {10.15251/CL.2024.215.431}
}