@Article{CL.2024.215.439,
AUTHOR = {W. H. Albanda, M. H. Saeed, M. Z. Abdullah, M. H. Al-Timimi},
TITLE = {Thickness variation on some physical properties of CdS: MgO films},
JOURNAL = {Chalcogenide Letters},
VOLUME = {21},
YEAR = {2024},
NUMBER = {5},
PAGES = {439--447},
URL = {http://www.techscience.com/CL/v21n5/65039},
ISSN = {1584-8663},
ABSTRACT = {In this study, CdS: MgO films were synthesized using the chemical spray pyrolysis 
method, varying the film thickness. X-ray diffraction (XRD) analysis confirmed the 
polycrystalline nature of the films, with an observed increase in average crystallite size 
corresponding to thicker films, and The films' surface morphology indicates an absence of 
crystal defects such as holes and voids . The investigation of energy gap and optical 
parameters revealed a dependency on film thickness, with the energy gap shifting from 
2.412 eV for a thickness of 150 nm to 2.354 eV for a thickness of 750 nm. Hall effect 
measurements demonstrated an augmentation in carrier concentration with increasing film 
thickness. The findings suggest a substantial influence of thickness on the physical 
properties of CdS: MgO thin films. Notably, thicker films exhibit characteristics that make 
them promising candidates for application as absorber layers in solar cells. This research 
provides valuable insights into tailoring the properties of these films for optimal 
performance in solar energy conversion devices, emphasizing the importance of 
controlling thickness in achieving desired electronic and optical characteristics.},
DOI = {10.15251/CL.2024.215.439}
}