@Article{CL.2025.222.143,
AUTHOR = {A. G. Kumar, V. K. V. Krishna, A. P. Lingaswamy, S. Masma, G. Prathibha, G. Sujatha, P. S. Kumar, T. V. Kumar, J. V. V. N. K. Rao, B. H. Rao},
TITLE = {Enhanced physical and optoelectronic properties of Ag-doped SnS thin films},
JOURNAL = {Chalcogenide Letters},
VOLUME = {22},
YEAR = {2025},
NUMBER = {2},
PAGES = {143--149},
URL = {http://www.techscience.com/CL/v22n2/64871},
ISSN = {1584-8663},
ABSTRACT = {SnS thin films doped with two atomic % Ag are deposited on a pyrex glass substrates 
using chemical bath deposition method. The impact of 2 atomic % silver doping on the 
physical properties of SnS thin films is studied. X-ray diffraction studies confirmed that 
the deposited SnS films were of α-SnS phase with an orthorhombic crystal structure, 
which remained stable despite the addition of 2 at.% silver. It is observed that the addition 
of 2 atomic % silver to SnS chemical bath solution does not greatly influence the structural 
properties of SnS thin film. The deposition is carried out at different bath temperatures 
from 50℃ to 80℃. Additionally, structural parameters such as crystallite size, dislocation 
density, and lattice strain were analyzed, offering deeper insights into the quality and 
structural properties of the SnS films. },
DOI = {10.15251/CL.2025.222.143}
}