@Article{CL.2025.223.197,
AUTHOR = {P. Kaushik, A. Devi, H. Singh},
TITLE = {Morphological study of bulk sample averse to thin films for a quaternary glassy alloy system},
JOURNAL = {Chalcogenide Letters},
VOLUME = {22},
YEAR = {2025},
NUMBER = {3},
PAGES = {197--204},
URL = {http://www.techscience.com/CL/v22n3/64900},
ISSN = {1584-8663},
ABSTRACT = {The structural properties of bulk as well as thin films of nanostructured Bi<sub>1</sub>Te<sub>15</sub>Se<sub>84-x</sub> Pb<sub>x</sub> (0 
≤ x ≤ 8) glassy alloys has been studied in this paper. Conventional melt quenching method 
is employed to prepare the samples of Bi<sub>1</sub>Te<sub>15</sub>Se<sub>84-x</sub> Pb<sub>x</sub> (0 ≤ x ≤ 8) alloys. Thin films with 
thickness of approximately 158nm of the obtained bulk compositions were deposited on dry 
cleaned glass substrates by thermal evaporation technique. The structural characterization 
was carried out using XRD and SEM. Energy dispersive X-ray spectroscopy (EDX) 
indicates that samples are nearly stoichiometric. X-ray diffraction patterns indicate that they 
are in the crystalline state. SEM study indicates the formation of snow flaky structures with 
agglomeration with the rise in lead content in the sample. Raman spectroscopy is used to 
study how changes in composition due to Pb doping affect lattice vibrations and electronphonon
 interactions.},
DOI = {10.15251/CL.2025.223.197}
}