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FP-STE: A Novel Node Failure Prediction Method Based on Spatio-Temporal Feature Extraction in Data Centers

Yang Yang1,*, Jing Dong1, Chao Fang2, Ping Xie3, Na An3

1 State Key Laboratory of Networking and Switching Technology, Beijing University of Posts and Telecommunications, Beijing, China
2 Beijing Smartchip Microelectronics Technology Company Limited, Beijing, China
3 The 54th Research Institute of CETC, Shijiazhuang, China

* Corresponding Author: Yang Yang. Email: email

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