Open Access iconOpen Access

REVIEW

A Thorough Investigation on Image Forgery Detection

Anjani Kumar Rai*, Subodh Srivastava

Department of Electronics & Communication Engineering, NIT, Patna, India

* Corresponding Author: Anjani Kumar Rai. Email: email

TSP_CMES_20920.pdf

  • 937

    View

  • 688

    Download

  • 0

    Like

Share Link