@Article{cmes.2004.005.497,
AUTHOR = {Dan Givoli},
TITLE = {Finite Element Modeling of Thin Layers},
JOURNAL = {Computer Modeling in Engineering \& Sciences},
VOLUME = {5},
YEAR = {2004},
NUMBER = {6},
PAGES = {497--514},
URL = {http://www.techscience.com/CMES/v5n6/33387},
ISSN = {1526-1506},
ABSTRACT = {Very thin layers with material properties which significantly differ from those of the surrounding medium appear in a variety of applications. Traditionally there are two extreme ways of handling such layers in finite element analysis: either they are fully modelled or they are totally ignored. The former option is often very expensive computationally, while the latter may lead to significant inaccuracies. Here a special technique of modeling thin layers is devised within the framework of the finite element method. This technique constitutes a prudent compromise between the two extremes mentioned above. The layer is replaced by an <i>interface</i>, namely a line or a surface (withzero thickness) in two-or three-dimensional analyses, respectively. Special <i>jump conditions</i> are imposed on this interface to model the effect of the layer. The method is presented in various configurations and variants, and its performance in one representative two-dimensionalcase is demonstrated via numerical experiments.},
DOI = {10.3970/cmes.2004.005.497}
}