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Dynamic Anti-plane Crack Analysis in Functional Graded Piezoelectric Semiconductor Crystals

J. Sladek1,2, V. Sladek1, E. Pan3, D.L. Young4

Institute of Construction and Architecture, Slovak Academy of Sciences, 84503 Bratislava, Slovakia.
Corresponding author.
Computer Modeling and Simulation Group, Department of Civil Engineering, University of Akron, Akron, OH 44325-3905, USA.
Department of Civil Engineering, National Taiwan University, Taipei, Taiwan.

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