TY  - EJOU
AU  - Ma, Yuyin 
AU  - Liu, Yufang 
AU  - Lu, Yijun 
AU  - Tian, Zhen 
AU  - Yuan, Fujiang 
AU  - Peng, Yanhong 

TI  - A Review of the Application of Machine Learning in Additive Manufacturing
T2  - Computers, Materials \& Continua

PY  - 
VL  - 
IS  - 
SN  - 1546-2226

AB  - Additive manufacturing (AM) has emerged as a transformative technology in modern manufacturing, offering unprecedented capabilities for producing complex geometries and customized components. However, the widespread adoption of AM is hindered by insufficient quality control, stemming from the multi-factor coupling characteristics of the manufacturing process. Machine learning (ML) presents a promising solution by enabling data-driven approaches to process optimization, quality prediction, and defect detection. This review examines the application landscape of ML techniques in AM through comprehensive analysis of recent literature. The study categorizes ML applications into four primary domains: real-time process monitoring and control, process parameter optimization and prediction, material property prediction, and quality inspection and defect identification. Random Forest (RF), neural networks (NN), and Support Vector Machines (SVM) emerge as the most widely adopted algorithms, demonstrating strong performance in handling high-dimensional, nonlinear relationships between process parameters and product quality. The analysis reveals that while ML methods have achieved significant success in offline prediction tasks, most research remains at the supervised learning stage, lacking cross-material adaptability, real-time feedback control capabilities, and model interpretability. The review identifies critical gaps in current research, including the need for closed-loop autonomous control systems, transfer learning across different materials and machines, and physics-informed ML models that integrate domain knowledge. This work provides a comprehensive reference for researchers and practitioners, highlighting both the achievements and limitations of ML applications in AM, and proposing future directions toward intelligent, autonomous, and high-reliability AM systems.
KW  - Additive manufacturing; machine learning; quality control; process optimization

DO  - 10.32604/cmc.2026.080309