%0 Journal Article
%A Yan, Ying
%A Yang, Yongqiang
%A Jiang, Cong
%A Suo, Bin
%A Sun, Kai

%D 
%J Computers, Materials \& Continua

%@ 1546-2226
%V 
%N 
%P {pages}

%T Fusing Multi-Source Information for Reliability Assessment under Uncertainty: An Approach Integrating D-S Evidence Theory with Wiener Process Degradation Modeling
%M doi:10.32604/cmc.2026.084652
%U http://www.techscience.com/cmc/online/detail/27493