@Article{cmc.2009.014.185,
AUTHOR = {Brent L.  Adams, Joshua  Kacher},
TITLE = {EBSD-Based Microscopy: Resolution of Dislocation Density},
JOURNAL = {Computers, Materials \& Continua},
VOLUME = {14},
YEAR = {2009},
NUMBER = {3},
PAGES = {185--196},
URL = {http://www.techscience.com/cmc/v14n3/22513},
ISSN = {1546-2226},
ABSTRACT = {Consideration is given to the resolution of dislocation density afforded by EBSD-based scanning electron microscopy. Comparison between the conventional Hough- and the emerging high-resolution cross-correlation-based approaches is made. It is illustrated that considerable care must be exercised in selecting a step size (Burger's circuit size) for experimental measurements. Important variables affecting this selection include the dislocation density and the physical size and density of dislocation dipole and multi-pole components of the structure. It is also illustrated that simulations can be useful to the interpretation of experimental recoveries.},
DOI = {10.3970/cmc.2009.014.185}
}