TY  - EJOU
AU  - Zhang, Y.B.  
AU  - Godfrey, A.  
AU  - Jensen, D. Juul  

TI  - Measurements of the Curvature of Protrusions/Retrusions on Migrating Recrystallization Boundaries
T2  - Computers, Materials \& Continua

PY  - 2009
VL  - 14
IS  - 3
SN  - 1546-2226

AB  - Two methods to quantify protrusions/retrusions and to estimate local boundary curvature from sample plane sections are proposed. The methods are used to evaluate the driving force due to curvature of the protrusions/retrusions for partially recrystallized pure nickel cold rolled to 96% reduction in thickness. The results reveal that the values calculated by both these methods are reasonable when compared with the stored energy measured by differential scanning calorimetry. The relationship between protrusions and the average stored energy density in the deformed matrix is also investigated for partially recrystallized pure aluminum cold rolled to 50%. The results show that the local deformed microstructure as well as local heterogeneities have to be analyzed in order to understand the formation of the protrusions.
KW  - Recrystallization
KW  -  protrusion and retrusion
KW  -  electron backscattering patterns (EBSP)
KW  -  boundary curvature
KW  -  stored energy

DO  - 10.3970/cmc.2009.014.197