@Article{cmc.2009.014.209,
AUTHOR = {C.M.  Hefferan, S.F.  Li, J.  Lind, U.  Lienert, A.D.  Rollett, P. Wynblatt, R.M.  Suter},
TITLE = {Statistics of High Purity Nickel Microstructure From High Energy X-ray Diffraction Microscopy},
JOURNAL = {Computers, Materials \& Continua},
VOLUME = {14},
YEAR = {2009},
NUMBER = {3},
PAGES = {209--220},
URL = {http://www.techscience.com/cmc/v14n3/22515},
ISSN = {1546-2226},
ABSTRACT = {We have measured and reconstructed via forward modeling a small volume of microstructure of high purity, well annealed nickel using high energy x-ray diffraction microscopy (HEDM). Statistical distributions characterizing grain orientations, intra-granular misorientations, and nearest neighbor grain misorientations are extracted. Results are consistent with recent electron backscatter diffraction measurements. Peaks in the grain neighbor misorientation angle distribution at 60 degrees (∑3) and 39 degrees (∑9) have resolution limited widths of ≈ 0.14 degree FWHM. The analysis demonstrates that HEDM can recover grain and grain boundary statistics comparable to OIM volume measurements; more extensive data sets will lead to full, five parameter grain boundary character distributions. Due to its non-destructive nature, HEDM can then watch, both statistically and through tracking of individual grains and boundaries, the evolution of such distributions with processing of the sample.},
DOI = {10.3970/cmc.2009.014.209}
}