TY  - EJOU
AU  - Hefferan, C.M.  
AU  - Li, S.F.  
AU  - Lind, J.  
AU  - Lienert, U.  
AU  - Rollett, A.D.  
AU  - Wynblatt, P. 
AU  - Suter, R.M.  

TI  - Statistics of High Purity Nickel Microstructure From High Energy X-ray Diffraction Microscopy
T2  - Computers, Materials \& Continua

PY  - 2009
VL  - 14
IS  - 3
SN  - 1546-2226

AB  - We have measured and reconstructed via forward modeling a small volume of microstructure of high purity, well annealed nickel using high energy x-ray diffraction microscopy (HEDM). Statistical distributions characterizing grain orientations, intra-granular misorientations, and nearest neighbor grain misorientations are extracted. Results are consistent with recent electron backscatter diffraction measurements. Peaks in the grain neighbor misorientation angle distribution at 60 degrees (∑3) and 39 degrees (∑9) have resolution limited widths of ≈ 0.14 degree FWHM. The analysis demonstrates that HEDM can recover grain and grain boundary statistics comparable to OIM volume measurements; more extensive data sets will lead to full, five parameter grain boundary character distributions. Due to its non-destructive nature, HEDM can then watch, both statistically and through tracking of individual grains and boundaries, the evolution of such distributions with processing of the sample.
KW  - microstructure
KW  -  high energy x-ray diffraction microscopy
KW  -  synchrotron radiation
KW  -  non-destructive orientation imaging

DO  - 10.3970/cmc.2009.014.209