TY  - EJOU
AU  - Jia, Fei  
AU  - Zheng, Xiu-Peng  
AU  - Cao, Yan-Ping  
AU  - Feng, Xi-Qiao  

TI  - Theoretical Study on the Bilayer Buckling Technique for Thin Film Metrology
T2  - Computers, Materials \& Continua

PY  - 2010
VL  - 18
IS  - 2
SN  - 1546-2226

AB  - Recently, a novel technique based on the wrinkling of a bilayer composite film resting on a compliant substrate was proposed to measure the elastic moduli of thin films. In this paper, this technique is studied via theoretical analysis and finite element simulations. We find that under an applied compressive strain, the composite system may exhibit various buckling modes, depending upon the applied compressive strain, geometric and material parameters of the system. The physical mechanisms underlying the occurrence of the two most typical buckling modes are analyzed from the viewpoint of energy. When the intermediate layer is much thicker than the top layer, the condition under which the bilayer buckling will occur prior to other modes is given. The results reported here may facilitate the design of the bilayer buckling technique for the thin film metrology.
KW  - Wrinkling
KW  -  bilayer
KW  -  thin film metrology
KW  -  finite element method

DO  - 10.3970/cmc.2010.018.105