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ARTICLE

Within-Project and Cross-Project Software Defect Prediction Based on Improved Transfer Naive Bayes Algorithm

Kun Zhu1, Nana Zhang1, Shi Ying1, *, Xu Wang2

1 School of Computer Science, Wuhan University, Wuhan, 430072, China.
2 Department of Computer Science, Vrije University Amsterdam, Amsterdam, 1081HV, The Netherlands.

* Corresponding Author: Shi Ying. Email: email.

TSP_CMC_8096.pdf

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