%0 Journal Article %A Zhang, Yan %A Han, Jin %A Yuan, Chengsheng %A Yang, Shuo %A Li, Chuanlong %A Sun, Xingming %D 2021 %J Computers, Materials \& Continua %@ 1546-2226 %V 66 %N 1 %P 563--574 %T A Rasterized Lightning Disaster Risk Method for Imbalanced Sets Using Neural Network %M doi:10.32604/cmc.2020.012502 %U http://www.techscience.com/cmc/v66n1/40465