
%0 Journal Article
%A Zaka, Azam
%A Jabeen, Riffat
%A Khan, Kanwal-Iqbal

%D 2022
%J Computers, Materials \& Continua

%@ 1546-2226
%V 70
%N 3
%P 4781--4802

%T Error Detection and Pattern Prediction Through Phase II Process Monitoring
%M doi:10.32604/cmc.2022.020316
%U http://www.techscience.com/cmc/v70n3/44956


