%0 Journal Article
%A Surendran, R.
%A Khalaf, Osamah-Ibrahim
%A Romero, Carlos-Andres-Tavera

%D 2022
%J Computers, Materials \& Continua

%@ 1546-2226
%V 70
%N 3
%P 6323--6338

%T Deep Learning Based Intelligent Industrial Fault Diagnosis Model
%M doi:10.32604/cmc.2022.021716
%U http://www.techscience.com/cmc/v70n3/45030