%0 Journal Article
%A Nguyen, Ham
%A Le, Tuong

%D 2022
%J Computers, Materials \& Continua

%@ 1546-2226
%V 72
%N 2
%P 3571--3583

%T A Fast Algorithm for Mining Top-Rank-<i>k</i> Erasable Closed Patterns
%M doi:10.32604/cmc.2022.024765
%U http://www.techscience.com/cmc/v72n2/47180