%0 Journal Article
%A Choi, Jeonghoon
%A Suh, Dongjun
%A Otto, Marc-Oliver

%D 2023
%J Computers, Materials \& Continua

%@ 1546-2226
%V 74
%N 2
%P 2945--2966

%T Boosted Stacking Ensemble Machine Learning Method for Wafer Map Pattern Classification
%M doi:10.32604/cmc.2023.033417
%U http://www.techscience.com/cmc/v74n2/50296