Open Access

ARTICLE

Boosted Stacking Ensemble Machine Learning Method for Wafer Map Pattern Classification

Jeonghoon Choi¹, Dongjun Suh^1,*, Marc-Oliver Otto²

1 Department of Convergence and Fusion System Engineering, Kyungpook National University, Sangju, 37224, Korea
2 Department of Mathematics, Natural and Economic Sciences, Ulm University of Applied Sciences, Ulm, 89075, Germany

* Corresponding Author: Dongjun Suh. Email: