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Boosted Stacking Ensemble Machine Learning Method for Wafer Map Pattern Classification

Jeonghoon Choi1, Dongjun Suh1,*, Marc-Oliver Otto2

1 Department of Convergence and Fusion System Engineering, Kyungpook National University, Sangju, 37224, Korea
2 Department of Mathematics, Natural and Economic Sciences, Ulm University of Applied Sciences, Ulm, 89075, Germany

* Corresponding Author: Dongjun Suh. Email: email

TSP_CMC_33417.pdf

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