%0 Journal Article
%A Shin, Hyunkyu
%A Ahn, Yonghan
%A Song, Mihwa
%A Gil, Heungbae
%A Choi, Jungsik
%A Lee, Sanghyo

%D 2023
%J Computers, Materials \& Continua

%@ 1546-2226
%V 75
%N 3
%P 4753--4766

%T Visualization for Explanation of Deep Learning-Based Defect Detection Model Using Class Activation Map
%M doi:10.32604/cmc.2023.038362
%U http://www.techscience.com/cmc/v75n3/52623