%0 Journal Article
%A Yang, Yang
%A Long, Yuhan
%A Lin, Yijing
%A Gao, Zhipeng
%A Rui, Lanlan
%A Yu, Peng

%D 2023
%J Computers, Materials \& Continua

%@ 1546-2226
%V 76
%N 3
%P 3623--3651

%T Two-Stage Edge-Side Fault Diagnosis Method Based on Double Knowledge Distillation
%M doi:10.32604/cmc.2023.040250
%U http://www.techscience.com/cmc/v76n3/54360