%0 Journal Article
%A Wan, Ming
%A Hao, Minglei
%A Li, Jiawei
%A Yao, Jiangyuan
%A Song, Yan

%D 2023
%J Computers, Materials \& Continua

%@ 1546-2226
%V 77
%N 3
%P 3573--3592

%T Functional Pattern-Related Anomaly Detection Approach Collaborating Binary Segmentation with Finite State Machine
%M doi:10.32604/cmc.2023.044857
%U http://www.techscience.com/cmc/v77n3/55060