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Defect Detection Model Using Time Series Data Augmentation and Transformation

Gyu-Il Kim1, Hyun Yoo2, Han-Jin Cho3, Kyungyong Chung4,*

1 Department of Computer Science, Kyonggi University, Suwon-si, 16227, Korea
2 Contents Convergence Software Research Institue, Kyonggi University, Suwon-si, 16227, Korea
3 Department of Energy IT Engineering, Far East University, Eumsung-gun, 27601, Korea
4 Division of AI Computer Science and Engineering, Kyonggi University, Suwon-si, 16227, Korea

* Corresponding Author: Kyungyong Chung. Email: email

TSP_CMC_46324.pdf

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