%0 Journal Article
%A Feng, Xiao
%A Liao, Xiao
%A Lin, Xiaokang
%A Wang, Yonggui

%D 2025
%J Computers, Materials \& Continua

%@ 1546-2226
%V 83
%N 1
%P 1307--1325

%T Root Security Parameter Generation Mechanism Based on SRAM PUF for Smart Terminals in Power IoT
%M doi:10.32604/cmc.2025.061069
%U http://www.techscience.com/cmc/v83n1/60110