%0 Journal Article
%A Mukundan, Arvind
%A Karmakar, Riya
%A Gupta, Devansh
%A Wang, Hsiang-Chen

%D 2026
%J Computers, Materials \& Continua

%@ 1546-2226
%V 86
%N 1
%P 1--23

%T Deep Learning-Based Toolkit Inspection: Object Detection and Segmentation in Assembly Lines
%M doi:10.32604/cmc.2025.069646
%U http://www.techscience.com/cmc/v86n1/64475