%0 Journal Article
%A Kim, Seoyun
%A Yu, Hyerim
%A Yoon, Jeewoo
%A Park, Eunil

%D 2024
%J Computer Systems Science and Engineering

%@ 
%V 48
%N 3
%P 861--861

%T Correction: Micro-Locational Fine Dust Prediction Utilizing Machine Learning  and Deep Learning Models
%M doi:10.32604/csse.2024.053659
%U http://www.techscience.com/csse/v48n3/56538