@Article{2018.100000011,
AUTHOR = {Yu-Cheng Chou, Wei-Chieh Liao, Yan-Liang Chen, Ming Chang, Po Ting Lin},
TITLE = {A Distributed Heterogeneous Inspection System for High Performance Inline Surface Defect Detection},
JOURNAL = {Intelligent Automation \& Soft Computing},
VOLUME = {25},
YEAR = {2019},
NUMBER = {1},
PAGES = {79--90},
URL = {http://www.techscience.com/iasc/v25n1/39632},
ISSN = {2326-005X},
ABSTRACT = {This paper presents the Distributed Heterogeneous Inspection System (DHIS), 
which comprises two CUDA workstations and is equipped with CPU distributed 
computing, CPU concurrent computing, and GPU concurrent computing 
functions. Thirty-two grayscale images, each with 5,000× 12,288 pixels and 
simulated defect patterns, were created to evaluate the performances of three 
system configurations: (1) DHIS; (2) two CUDA workstations with CPU 
distributed computing and GPU concurrent computing; (3) one CUDA 
workstation with GPU concurrent computing. Experimental results indicated 
that: (1) only DHIS can satisfy the time limit, and the average turnaround time 
of DHIS is 37.65% of the time limit; (2) a good linear relationship exists 
between the processing speed ratio and the instruction sequence quantity ratio.},
DOI = {10.31209/2018.100000011}
}