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ARTICLE

Line Trace Effective Comparison Algorithm Based on Wavelet Domain DTW

Nan Pan1, Yi Liu2, Dilin Pan2, Junbing Qian1, Gang Li3

1 Faculty of Civil Aviation and Aeronautical, Kunming University of Science & Technology, Kunming 650500, P.R. China
2 Kunming SNLab Tech Co., Ltd., Kunming 650228, P.R. China
3 Institute of Forensic science, Shijiazhuang Public Security Bureau, Shijiazhuang 050021, P.R. China

* Corresponding Author: Nan Pan, email

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