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Identification of Abnormal Patterns in AR (1) Process Using CS-SVM

Hongshuo Zhang1, Bo Zhu1,*, Kaimin Pang1, Chunmei Chen1, Yuwei Wan2

1 College of Mechanical and Electrical Engineering, Kunming University of Science & Technology, Kunming, 650500, China
2 School of Engineering, Cardiff University, Cardiff, CF24 3AA, UK

* Corresponding Author: Bo Zhu. Email: email

TSP_IASC_17232.pdf

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