%0 Journal Article
%A Pan, Nan
%A Liu, Yi
%A Pan, Dilin
%A Qian, Junbing
%A Li, Gang

%D 2025
%J Intelligent Automation \& Soft Computing

%@ 2326-005X
%V 40
%N 1
%P 145--145

%T Retraction: Line Trace Effective Comparison Algorithm Based on Wavelet Domain DTW
%M doi:10.32604/iasc.2025.062707
%U http://www.techscience.com/iasc/v40n1/59362