@Article{icces.2009.010.007,
AUTHOR = {D. Balzar},
TITLE = {Crystallite Size Distribution Determination By X-Ray Diffraction},
JOURNAL = {The International Conference on Computational \& Experimental Engineering and Sciences},
VOLUME = {10},
YEAR = {2009},
NUMBER = {1},
PAGES = {7--8},
URL = {http://www.techscience.com/icces/v10n1/31621},
ISSN = {1933-2815},
ABSTRACT = {X-ray diffraction is a useful technique for the estimation of size distributions of smaller crystallites. With the constant improvement of experimental techniques, especially with the advent of new-generation synchrotron and neutron sources with superior resolution, these size distributions can be precisely determined. Furthermore, modern methods for the analysis of X-ray diffraction patterns, such as Rietveld refinement, increasingly go beyond the determination of structural parameters and include refinable parameters for a physical crystallite size distribution.<br/><br/>
Several common size distributions (such as lognormal and gamma) will be considered. Particularly, a lognormal distribution of both ellipsoidal and cylindrical crystals with elliptical cross-sections can be used to successfully model anisotropic size broadening. In an example (ZnO powder), the apparent crystallite most closely resembling the shape obtained by the spherical-harmonics model was obtained by usinga bimodal lognormal distribution of ellipsoidal crystallites with two different shapes, corresponding to two size-distribution modes. This shape of the apparent crystallite is in agreement with those reported earlier from X-ray diffraction line broadening analysis and TEM for this sample.
},
DOI = {10.3970/icces.2009.010.007}
}