@Article{icces.2011.018.073,
AUTHOR = {Xuedong Bai},
TITLE = {Structure-resolved properties of nanomaterials probed by in-situ TEM},
JOURNAL = {The International Conference on Computational \& Experimental Engineering and Sciences},
VOLUME = {18},
YEAR = {2011},
NUMBER = {3},
PAGES = {73--74},
URL = {http://www.techscience.com/icces/v18n3/33210},
ISSN = {1933-2815},
ABSTRACT = {The in-situ transmission electron microscopy (TEM) method has been developed to probe the novel properties of nanomateials. It is powerful in a way that it can directly correlate the microstructure of the nanomaterials with their physical properties for the same nanoscale sample. In this talk, I will report on the construction and applications of a home-made in-situ TEM platform for nanomanipulation and nanomeasurements.<br/>
<br/>
Mechanics and electromechanical coupling of individual nanowires have been studied inside TEM. The mechanism of resistance switching effects of nanoscale ionic conductors has been revealed by in-situ TEM high-resolution observation. And the transport properties of carbon nanotubes and graphene will be also included in this talk.},
DOI = {10.3970/icces.2011.018.073}
}