TY  - EJOU
AU  - Xia, Yifan  
AU  - Wang, Jie  

TI  - Phase-field simulation of domain evolution in ferroelectric thin films with deadlayers
T2  - The International Conference on Computational \& Experimental Engineering and Sciences

PY  - 2011
VL  - 20
IS  - 3
SN  - 1933-2815

AB  - Phase field simulation is an effective way to predict the domain evolution in ferroelectric materials. A phase field model is developed to investigate the domain structures and polarization switching in in ferroelectric thin films with deadlayers. Simulation results show that the deadlayers as well as misfit strain have a significant influence on the domain structures and polarization switching in the ferroelectric thin films. It is found that the simulated switching electric field in ferroelectric thin films decreases with the thickness of the deadlayers increasing.
KW  - 

DO  - 10.3970/icces.2011.020.087