Zhunruo Feng1, Ruomeng Shi2, Yuhan Jiang3, Yiming Han1, Zeyang Ma1, Yuheng Ren4,*
CMC-Computers, Materials & Continua, Vol.84, No.2, pp. 3559-3575, 2025, DOI:10.32604/cmc.2025.065152
- 03 July 2025
Abstract In this study, we propose Space-to-Depth and You Only Look Once Version 7 (SPD-YOLOv7), an accurate and efficient method for detecting pests in maize crops, addressing challenges such as small pest sizes, blurred images, low resolution, and significant species variation across different growth stages. To improve the model’s ability to generalize and its robustness, we incorporate target background analysis, data augmentation, and processing techniques like Gaussian noise and brightness adjustment. In target detection, increasing the depth of the neural network can lead to the loss of small target information. To overcome this, we introduce the… More >