Xianyu Su, Qican Zhang, Wenjing Chen
The International Conference on Computational & Experimental Engineering and Sciences, Vol.18, No.3, pp. 77-78, 2011, DOI:10.3970/icces.2011.018.077
Abstract Fourier transform method has been widely sued on fringe analysis in optical metrology, including the structured illumination metrology and the interference metrology. The Fourier transform profilometry is one of the popular non-contact 3-D shape measurement methods, where a Ronchi grating or sinusoidal grating is projected onto a 3-D diffuse surface, and the resulting deformed grating image is detected by a CCD camera and processed by a computer. This method requires only one frame of the deformed fringe pattern to retrieve the surface of measured object, so it has obvious advantage for real-time data acquisition and… More >