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Crop Yield Prediction Using Machine Learning Approaches on a Wide Spectrum

S. Vinson Joshua1, A. Selwin Mich Priyadharson1, Raju Kannadasan2, Arfat Ahmad Khan3, Worawat Lawanont3,*, Faizan Ahmed Khan4, Ateeq Ur Rehman5, Muhammad Junaid Ali6

1 Department of Electronics and Communication Engineering, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Chennai, 600062, India
2 Department of Electrical and Electronics Engineering, Sri Venkateswara College of Engineering, Sriperumbudur, 602117, India
3 Suranaree University of Technology, Nakhon Ratchasima, 30000, Thailand
4 University of Central Punjab, Lahore, 54000, Pakistan
5 Government College University, Lahore, 54000, Pakistan
6 Virtual University of Pakistan, Islamabad Campus, 45550, Pakistan

* Corresponding Author: Worawat Lawanont. Email: email

TSP_CMC_27178.pdf

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