Open Access iconOpen Access

ARTICLE

crossmark

Physical Properties of SiC Nanostructure for Optoelectronics Applications

Mayyadah H. Mohsin1, Najwan H. Numan2, Evan T. Salim1,*, Makram A. Fakhri2,*

1 Applied Science Department, University of Technology-Iraq, Baghdad, 10066, Iraq
2 Laser and Optoelectronic Engineering Department, University of Technology-Iraq, Baghdad, 10066, Iraq

* Corresponding Authors: Evan T. Salim. Email: email; Makram A. Fakhri. Email: email

TSP_JRM_15465.pdf

  • 2831

    View

  • 1622

    Download

  • 0

    Like

Share Link