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Surface Electric Gibbs Free Energy and Its Effect on the Electromechanical Behavior of Nano-Dielectrics

Ying Xu1, Shengping Shen1,2

State Key Laboratory for Strength and Vibration of Mechanical Structures, School of Aerospace, Xi’an Jiaotong University, 28 West Xianning Road, Xi’ an, Shaanxi 710049, PR China
Tel/Fax: 86-29-82660977; E-mail: sshen@mail.xjtu.edu.cn

Computers, Materials & Continua 2012, 28(1), 81-96. https://doi.org/10.3970/cmc.2012.028.081

Abstract

This paper considers the surface effect through the surface and bulk electric Gibbs free energy. The analytical expressions are derived for the effective elastic, dielectric and piezoelectric modulus for nano-structural elements in electromechanical coupling problems. Numerical examples for PZT are given to illustrate the size effects on the electromechanical properties of nano-particles, nano-wires and nano-films quantitatively. The solution shows that the electromechanical properties of piezoelectric nano-material are size-dependent but the size effects on the elastic property and dielectric property are different.

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APA Style
Xu, Y., Shen, S. (2012). Surface electric gibbs free energy and its effect on the electromechanical behavior of nano-dielectrics. Computers, Materials & Continua, 28(1), 81-96. https://doi.org/10.3970/cmc.2012.028.081
Vancouver Style
Xu Y, Shen S. Surface electric gibbs free energy and its effect on the electromechanical behavior of nano-dielectrics. Comput Mater Contin. 2012;28(1):81-96 https://doi.org/10.3970/cmc.2012.028.081
IEEE Style
Y. Xu and S. Shen, “Surface Electric Gibbs Free Energy and Its Effect on the Electromechanical Behavior of Nano-Dielectrics,” Comput. Mater. Contin., vol. 28, no. 1, pp. 81-96, 2012. https://doi.org/10.3970/cmc.2012.028.081



cc Copyright © 2012 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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