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MSICST: Multiple-Scenario Industrial Control System Testbed for Security Research

Wei Xu1,2, Yaodong Tao2,3, Chunfang Yang4,*, Huiqin Chen5

University of Science and Technology of China, Hefei, Anhui, 230026, China.
National Joint Engineering Lab for ICS Security of 360ESG, Beijing, 100000, China.
Shenyang Institute of Computing Technology of CAS, Shenyang, Liaoning, 110168, China.
Zhengzhou Science and Technology Institute, Zhengzhou, Henan, 450001, China.
University of Michigan Transportation Research Institute, USA.

* Corresponding Author: Chunfang Yang. Email: email.

Computers, Materials & Continua 2019, 60(2), 691-705. https://doi.org/10.32604/cmc.2019.05678

Abstract

A security testbed is an important aspect of Industrial Control System (ICS) security research. However, existing testbeds still have many problems in that they cannot fully simulate enterprise networks and ICS attacks. This paper presents a Multiple-Scenario Industrial Control System Testbed (MSICST), a hardware-in-the-loop ICS testbed for security research. The testbed contains four typical process scenarios: thermal power plant, rail transit, smart grid, and intelligent manufacturing. We use a combination of actual physical equipment and software simulations to build the process scenario sand table and use real hardware and software to build the control systems, demilitarized zone, and enterprise zone networks. According to the ICS cyber kill chain, the attacker is modeled, and two typical attack scenarios are constructed in the testbed. Through research into this security solution, whitelist-based host protection and a new Intrusion Detection System (IDS) are proposed and tested.

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APA Style
Xu, W., Tao, Y., Yang, C., Chen, H. (2019). MSICST: multiple-scenario industrial control system testbed for security research. Computers, Materials & Continua, 60(2), 691-705. https://doi.org/10.32604/cmc.2019.05678
Vancouver Style
Xu W, Tao Y, Yang C, Chen H. MSICST: multiple-scenario industrial control system testbed for security research. Comput Mater Contin. 2019;60(2):691-705 https://doi.org/10.32604/cmc.2019.05678
IEEE Style
W. Xu, Y. Tao, C. Yang, and H. Chen "MSICST: Multiple-Scenario Industrial Control System Testbed for Security Research," Comput. Mater. Contin., vol. 60, no. 2, pp. 691-705. 2019. https://doi.org/10.32604/cmc.2019.05678

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cc This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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