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A Modified Multiscale Model for Microcantilever Sensor

Yan Zhang1, Shengping Shen1

MOE Key Laboratory for Strength and Vibration, School of Aerospace, Xi’an Jiaotong University, Xi’an 710049, China

Computers, Materials & Continua 2008, 8(1), 17-22. https://doi.org/10.3970/cmc.2008.008.017

Abstract

In this paper, an existed model for adsorption-induced surface stress is modified with physical clarity, based on the equilibrium of force. In the proposed multiscale model, a four-atom system is used, instead of the existed three-atom system which did not consider the force equilibrium. By analyzing the force state of an atom, the thickness of the first layer atoms can be determined. Thus, the proposed model does not need to determine the layer-thickness by experiments or artificially. The results obtained from the proposed model agree very well with the experimental data. This paper is helpful to investigate the atomistic theory of the microcantilever sensor.

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Cite This Article

APA Style
Zhang, Y., Shen, S. (2008). A modified multiscale model for microcantilever sensor. Computers, Materials & Continua, 8(1), 17-22. https://doi.org/10.3970/cmc.2008.008.017
Vancouver Style
Zhang Y, Shen S. A modified multiscale model for microcantilever sensor. Comput Mater Contin. 2008;8(1):17-22 https://doi.org/10.3970/cmc.2008.008.017
IEEE Style
Y. Zhang and S. Shen, “A Modified Multiscale Model for Microcantilever Sensor,” Comput. Mater. Contin., vol. 8, no. 1, pp. 17-22, 2008. https://doi.org/10.3970/cmc.2008.008.017



cc Copyright © 2008 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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