Jun Liu1, Mauro Ferrari1
CMES-Computer Modeling in Engineering & Sciences, Vol.4, No.3&4, pp. 421-430, 2003, DOI:10.3970/cmes.2003.004.421
Abstract A microstructure-accounting mechanical field theory approach is applied to the problem of reflection from a granular thin layer embedded between two solid substrates to study the direct relationship of the micro-structural parameters and the overall reflection coefficients of the thin layer. The exact solution for plane wave reflection coefficients is derived under the new theoretical framework giving quantitative relations between the macroscopic reflection coefficients and a set of micro structural/physical parameters including particle size and micromoduli. The model was analyzed using averaged material properties of biological tissue for the granular thin layer. It was demonstrated that changes in micro-level physical… More >
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